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Track 1 Session 9
8:00 to 9:00 a.m. Friday March 27, 2009
Reliability Prediction Models Based on Accelerated Testing
and In-Service Field Return
It is currently more and more difficult to validate
the reliability models of electronic components. Indeed, an intrinsic antagonism
appears between a high reliability level and the information weakness issued both
from the test results and the experienced returns. In order to overcome this problem,
we propose to reduce the model uncertainty by using diverse available information:
physical (model structure), experimental (accelerated tests) and statistical
(data processing). This methodology is applied to an electronic sensor having two
failure modes. Its resulting reliability model is validated by a comparison between
operation and expected failure rates observed and calculated for the mission profile
of a civil aircraft. Taking into account the parametric uncertainties, such a
comparison must be considered from a probabilistic point of view.
Key Words: Accelerated
Tests, Reliability Prediction, FIDES, Mission Profile, NHPP, Weibull
Franck Bayle
Thales Avionics
France |
