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Track 1 Session 1
9:10 to 10:10 a.m. Wednesday March 25, 2009
Reliability Demonstration: A Practical Approach to the Verification of
Reliability Budgets
Highly Accelerated Testing (HAT) is a powerful tool in developing robust systems as it gives early feedback to the engineers on design
margins with respect to environmental stresses. Weibull analysis, on the other hand, is used to predict the probability of product
failures in the market. Yet in complex systems reliability is often managed by reliability budgeting, where not only lifetime but also
tolerance build-up issues are important for reliability in the field. Designers rely on documented specifications, but as statistics and
tolerance build-up always play a part, how sure can they be that every system built will work as planned? This presentation will show
an approach that can be used to demonstrate the reliability margins for a component with respect to its design limits and to verify its
compliance with the attributed reliability budget. The presented approach is based on the combination of CTQ selection, HAT
experiments and Weibull analysis for environmental and user profile related stress conditions. Two case studies will be presented, one
on a universal power supply in consumer applications, the other in the area of Radio Frequency Identification (RFID).
Key Words: Reliability Engineering, HAT, DFSS, Weibull Analysis,
Field Call
Rate, Reliability Budgeting
Ludo Stulens
Philips Applied Technologies
The Netherlands |
